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Article Dans Une Revue Microscopy and Microanalysis Année : 2020

Direct Observation of the Surface Topography at High Temperature with SEM

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Résumé

High-temperature scanning electron microscopy allows the direct study of the temperature behavior of materials. Using a newly developed heating stage, tilted images series were recorded at high temperature and 3D images of the sample surface were reconstructed. By combining 3D images recorded at different temperatures, the variations of material roughness can be accurately described and associated with local changes in the topography of the sample surface.

Domaines

Chimie
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Dates et versions

hal-03003458 , version 1 (13-11-2020)

Identifiants

Citer

Renaud Podor, X. F Le Goff, Joseph Lautru, H.P. Brau, Mathias Barreau, et al.. Direct Observation of the Surface Topography at High Temperature with SEM. Microscopy and Microanalysis, 2020, 26 (3), pp.397-402. ⟨10.1017/S1431927620001348⟩. ⟨hal-03003458⟩
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