Phase equilibria in the Cr-Si-Ti system below 40 at.% Si

Abstract : Phase transformations in the Cr-Si-Ti ternary system have been studied using differential thermal analysis (DTA), X-ray diffraction (XRD), scanning electron microscopy (SEM) and electron probe microanalysis (EPMA) at silicon content <40 at.%. Partial liquidus and solidus projections and the melting diagram (solidus + liquidus) have been constructed. Some sections as partial isothermal at 1450 and 1150 °C, isopleths at 10 at.% Si and 50 at.% Ti are described. The liquidus surface is characterized by the presence of primary crystallization regions of a solid solution (Cr,βTi) and binary based phases (Cr3Si), (Ti5Si5) and the Laves-phase C14, which is stabilized by additions of silicon, and in the ternary system melts congruently above 1600 °C. The solidus surface is characterized by the presence of three-phase fields: (γTiCr2) + (Cr3Si) + (Cr,βTi), (Ti5Si3) + (γTiCr2) + (βTi,Cr) and (Ti5Si3) + (γTiCr2) + (Cr3Si). The former two regions form invariant four-phase eutectic equilibria L ↔ (βTiCr2) + (Cr3Si) + (Cr,βTi) and L ↔ (Ti5Si3) + (γTiCr2) + (βTi,Cr) at 1534 and 1243 °C, respectively. The maximum of the solidus temperature of about 1580 °C is observed in the field (γTiCr2) + (Cr,βTi). At 1495 °C the solid-state transformation (γTiCr2) + (Cr3Si) ↔ (Ti5Si3) + (Cr,βTi) takes place.
Type de document :
Article dans une revue
Domaine :
Liste complète des métadonnées
Contributeur : Odile Hennaut <>
Soumis le : mardi 26 mars 2019 - 13:42:12
Dernière modification le : mardi 28 mai 2019 - 14:06:15




M. Bulanova, J.C. Tedenac, I. Fartushna, K. Meleshevich, K. Darmostuk. Phase equilibria in the Cr-Si-Ti system below 40 at.% Si. Journal of Alloys and Compounds, Elsevier, 2019, 785, pp.897-910. ⟨10.1016/j.jallcom.2019.01.222⟩. ⟨hal-02080000⟩



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