Mechanical properties of SiC nanowires determined by scanning electron and field emission microscopies - Université de Montpellier
Article Dans Une Revue Physical Review B: Condensed Matter and Materials Physics (1998-2015) Année : 2008
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hal-01701887 , version 1 (06-02-2018)

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S. Perisanu, V. Gouttenoire, P. Vincent, A. Ayari, M. Choueib, et al.. Mechanical properties of SiC nanowires determined by scanning electron and field emission microscopies. Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2008, 77 (16), ⟨10.1103/PhysRevB.77.165434⟩. ⟨hal-01701887⟩
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