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Mots clés
Pulsed laser deposition
Nanoparticles
EPR
Energy loss
SiC
Magnetic semiconductors
Al2O3
XPS
27Aldp
7630Lh
8140Ef
NRP
3C-SiC
Nitridation
Nanostructures
XRD
Nickel
Magnetization curves
Alloy
18O
Channeling
Silicon Carbide
X-ray diffraction
Low energy electron diffraction LEED
Charge exchange
Silicon carbide
Aluminum
Magnetic anisotropy
Topological defects
Kossel diffraction
27Alda
Adsorption Isotherms
Sputtering
Epitaxial growth
18O resonance
Adsorbed layers
Stable isotopic tracing
7550Ee
Hysteresis
Nuclear reaction analysis
Ion beam analysis
Auger electron spectroscopy AES
Atomic Layer Deposition ALD
Raman spectroscopy
27Ald p&α
Acoustic
Isotopic Tracing
6855Jk
Multilayer
Density functional theory
Interface defects
Metal-insulator transition
Ferromagnetic resonance
15N
Rutherford backscattering spectrometry RBS
13C
Oxygen deficiency
Defects
ADSORPTION DESORPTION HYSTERESIS
17Opp
17O
RBS
Acoustic propreties of solid
PIXE
AFM
Evaluation
Epitaxy
Passivation
17Op
Transparent conductive oxide TCO
Adsorption
AC susceptibility
Pb centers
Silicon
Indium oxide
Annealing
Growth
Capillary condensation
GaMnAs
Silica
Thin film
Gallium oxide
7550Pp
Diffusion
Thin films
Ageing
Nuclear resonance profiling NRP
HfO2
Photoluminescence
Gold
Oxidation
2H
Measurement
ALD
Periodic multilayer
Topological insulators
Aluminium
Zinc oxide
Ion implantation
Alloys