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H. von Bardeleben, Jean-Louis Cantin, A. Parisini, A. Bosio, R. Fornari. Conduction mechanism and shallow donor properties in silicon-doped ɛ -G a 2 O 3 thin films: An electron paramagnetic resonance study. Physical Review Materials, 2019, 3 (8), pp.084601. ⟨10.1103/PhysRevMaterials.3.084601⟩. ⟨hal-03924960⟩
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Abdo Hassoun, Shahida Anusha Siddiqui, Slim Smaoui, İ̇lknur Ucak, Rai Naveed Arshad, et al.. Emerging Technological Advances in Improving the Safety of Muscle Foods: Framing in the Context of the Food Revolution 4.0. Food Reviews International, 2024, 40 (1), pp.37-78. ⟨10.1080/87559129.2022.2149776⟩. ⟨hal-04032389⟩
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Bingbing Xia, Jean-Jacques Ganem, Ian Vickridge, Emrick Briand, Sébastien Steydli, et al.. Water-rich conditions during titania atomic layer deposition in the 100 °C-300 °C temperature window produce films with TiIV oxidation state but large H and O content variations. Applied Surface Science, 2022, 601, pp.154233. ⟨10.1016/j.apsusc.2022.154233⟩. ⟨hal-03907172⟩
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Dépôts en texte intégral
93
Mots clés
Capillary condensation
Epitaxial growth
Diffusion
18O resonance
Adsorbed layers
Density functional theory
Raman spectroscopy
Growth
Nitridation
18O
27Ald p&α
Topological defects
Multilayer
Isotopic Tracing
Periodic multilayer
Al2O3
Energy loss
Adsorption Isotherms
Ferromagnetic resonance
Silica
15N
Ion beam analysis
Alloy
Auger electron spectroscopy AES
27Aldp
RBS
27Alda
Acoustic
Passivation
Annealing
ADSORPTION DESORPTION HYSTERESIS
Aluminium
Silicon carbide
Nuclear reaction analysis
Nanoparticles
SiC
Gallium oxide
Metal-insulator transition
Atomic Layer Deposition ALD
2H
6855Jk
Channeling
Indium oxide
Kossel diffraction
Hysteresis
7630Lh
Silicon Carbide
Acoustic propreties of solid
Silicon
X-ray diffraction
Alloys
XPS
Nuclear resonance profiling NRP
Magnetic semiconductors
AFM
17Op
Rutherford backscattering spectrometry RBS
GaMnAs
Magnetization curves
7550Ee
Oxygen deficiency
Evaluation
Aluminum
Ageing
17O
Transparent conductive oxide TCO
Defects
17Opp
Oxidation
HfO2
8140Ef
Charge exchange
Measurement
XRD
Topological insulators
7550Pp
Pulsed laser deposition
Photoluminescence
Interface defects
Low energy electron diffraction LEED
ALD
PIXE
13C
Magnetic anisotropy
3C-SiC
NRP
Nanostructures
Sputtering
Pb centers
Stable isotopic tracing
Adsorption
Thin film
Epitaxy
AC susceptibility
Gold
Zinc oxide
Thin films
Nickel
Ion implantation
EPR