M. Barreau, C. Méthivier, T. Sturel, C. Allely, P. Drillet et al., In situ surface imaging: High temperature environmental SEM study of the surface changes during heat treatment of an Al Si coated boron steel, Materials Characterization, vol.163, p.110266, 2020.
URL : https://hal.archives-ouvertes.fr/hal-03003417

J. Broekmaat, A. Brinkman, D. H. Blank, and G. Rijnders, High temperature surface imaging using atomic force microscopy, Applied Physics Letters, vol.92, issue.4, p.043102, 2008.

A. Chandra, R. Nakatani, T. Uchiyama, Y. Seino, H. Sato et al., Self-Assembly: Direct In Situ Observation of the Early-Stage Disorder-Order Evolution of Perpendicular Lamellae in Thermally Annealed High-? Block Copolymer Thin Films (Adv. Mater. Interfaces 11/2019), Advanced Materials Interfaces, vol.6, issue.11, p.1970067, 2019.

A. Chandra, R. Nakatani, T. Uchiyama, Y. Seino, H. Sato et al., Direct In Situ Observation of the Early?Stage Disorder?Order Evolution of Perpendicular Lamellae in Thermally Annealed High?? Block Copolymer Thin Films, Advanced Materials Interfaces, vol.6, issue.11, p.1801401, 2019.

. Digitalsurf-mountains,

D. W. Fan and B. C. De-cooman, State-of-the-Knowledge on Coating Systems for Hot Stamped Parts, steel research international, vol.83, issue.5, pp.412-433, 2012.

R. Grigorieva, P. Drillet, J. M. Mataigne, and A. Redjaïmia, Phase Transformations in the Al-Si Coating during the Austenitization Step, Solid State Phenomena, vol.172-174, pp.784-790, 2011.
URL : https://hal.archives-ouvertes.fr/tel-01754556

J. K. Hobbs, O. E. Farrance, and L. Kailas, How atomic force microscopy has contributed to our understanding of polymer crystallization, Polymer, vol.50, issue.18, pp.4281-4292, 2009.

F. Jenner, M. E. Walter, R. Mohan-iyengar, and R. Hughes, Evolution of Phases, Microstructure, and Surface Roughness during Heat Treatment of Aluminized Low Carbon Steel, Metallurgical and Materials Transactions A, vol.41, issue.6, pp.1554-1563, 2010.

W. Joachimi, M. Hemmleb, U. Grauel, Z. Wang, M. Willinger et al., High-Temperature BSE and EBAC Electronics for ESEM, Microscopy and Microanalysis, vol.24, issue.S1, pp.694-695, 2018.

H. Karbasian and A. E. Tekkaya, A review on hot stamping, Journal of Materials Processing Technology, vol.210, issue.15, pp.2103-2118, 2010.

D. Li, situ high temperature surface morphology using 3D profilometry, 2015.

W. Liang, W. Tao, B. Zhu, and Y. Zhang, Influence of heating parameters on properties of the Al-Si coating applied to hot stamping, Science China Technological Sciences, vol.60, issue.7, pp.1088-1102, 2017.

H. Mansour, Caractérisation des défauts cristallins au MEB par canalisation d'électrons assistée par diagrammes pseudo-Kikuchi haute résolution : application à l'acier IF, UO2 et TiAl, 2016.

, http://www.qualitaetszirkel.ch, PrimaryCare, vol.1, issue.08, pp.200-200, 2001.

. Nkou, G. I. Bouala, N. Clavier, J. Lechelle, A. Mesbah et al., situ HT-ESEM study of crystallites growth within CeO2 microspheres, vol.41, pp.14703-14711, 2015.
URL : https://hal.archives-ouvertes.fr/hal-02000073

R. Podor, X. Le-goff, T. Cordara, M. Odorico, J. Favrichon et al., 3D-SEM height maps series to monitor materials corrosion and dissolution, Materials Characterization, vol.150, pp.220-228, 2019.
URL : https://hal.archives-ouvertes.fr/hal-02064121

R. Podor, G. I. Bouala, J. Ravaux, J. Lautru, and N. Clavier, Working with the ESEM at high temperature, Materials Characterization, vol.151, pp.15-26, 2019.
URL : https://hal.archives-ouvertes.fr/hal-02064126

E. Ponz, J. L. Ladaga, and R. D. Bonetto, Measuring Surface Topography with Scanning Electron Microscopy. I. EZEImage: A Program to Obtain 3D Surface Data, Microscopy and Microanalysis, vol.12, issue.2, pp.170-177, 2005.

V. G. Rivlin and G. V. Raynor, 4: Critical evaluation of constitution of aluminium-iran-silicon system, International Metals Reviews, vol.26, issue.1, pp.133-152, 1981.

S. B. Roobol, M. E. Cañas-ventura, M. Bergman, M. A. Van-spronsen, W. G. Onderwaater et al., The ReactorAFM: Non-contact atomic force microscope operating under high-pressure and high-temperature catalytic conditions, Review of Scientific Instruments, vol.86, issue.3, p.033706, 2015.

Q. Shi, S. Roux, F. Latourte, F. Hild, D. Loisnard et al., Measuring topographies from conventional SEM acquisitions, Ultramicroscopy, vol.191, pp.18-33, 2018.
URL : https://hal.archives-ouvertes.fr/hal-01970210

W. Slówko, A. Wiatrowski, and M. Krysztof, Detection of secondary and backscattered electrons for 3D imaging with multi-detector method in VP/ESEM, Micron, vol.104, pp.45-60, 2018.

A. P. Tafti, A. B. Kirkpatrick, Z. Alavi, H. A. Owen, and Z. Yu, Recent advances in 3D SEM surface reconstruction, Micron, vol.78, pp.54-66, 2015.

A. P. Tafti, J. D. Holz, A. Baghaie, H. A. Owen, M. M. He et al., 3DSEM++: Adaptive and intelligent 3D SEM surface reconstruction, Micron, vol.87, pp.33-45, 2016.

. Tescan, LAS VEGAS SANDS CORP., a Nevada corporation, Plaintiff, v. UKNOWN REGISTRANTS OF www.wn0000.com, www.wn1111.com, www.wn2222.com, www.wn3333.com, www.wn4444.com, www.wn5555.com, www.wn6666.com, www.wn7777.com, www.wn8888.com, www.wn9999.com, www.112211.com, www.4456888.com, www.4489888.com, www.001148.com, and www.2289888.com, Defendants., Gaming Law Review and Economics, vol.20, issue.10, pp.859-868, 2016.

D. Weili, Z. Yanxin, L. Haojian, W. Wenfeng, and S. Yajing, Automatic 3D reconstruction of SEM images based on Nano-robotic manipulation and epipolar plane images, Ultramicroscopy, vol.200, pp.149-159, 2019.