Skip to Main content Skip to Navigation
Journal articles

Rhombohedral and Turbostratic Boron Nitride: X-ray Diffraction and Photoluminescence Signatures

Abstract : Boron Nitride (BN) layers with sp2 bonding have been grown by Metal Organic Chemical Vapor Deposition (MOCVD) on AlN underlayers themselves deposited on c-plane sapphire substrates. Two different boron precursors were employed: trimethylboron (TMB) and triethylboron (TEB) while ammonia was used as the nitrogen precursor. The BN obtained epitaxial BN films contain ordered rhombohedral (rBN) and partially ordered turbostratic (tBN) stackings as evidenced by Xray Diffraction analysis. We discriminatively identify the PL signatures of the rBN and tBN from those typical of the hexagonal (hBN) and Bernal stackings (bBN). The optical signature of tBN appears at 5.45eV and it intercalates between the two recombination bands typical of rBN at 5.35 eV ( strong intensity) and 5.55 eV(weaker intensity) . The analogs of the high intensity band at 5.35 eV in rBN sit at 5.47 eV for hBN and at 5.54 eV for bBN.
Document type :
Journal articles
Complete list of metadata
Contributor : L2c Aigle Connect in order to contact the contributor
Submitted on : Tuesday, May 31, 2022 - 2:50:47 PM
Last modification on : Friday, August 5, 2022 - 2:44:08 PM


Publisher files allowed on an open archive


Distributed under a Creative Commons Attribution 4.0 International License




Matthieu Moret, Adrien Rousseau, Pierre Valvin, Shashim Sharma, Laurent Souqui, et al.. Rhombohedral and Turbostratic Boron Nitride: X-ray Diffraction and Photoluminescence Signatures. Applied Physics Letters, American Institute of Physics, 2022, 119 (26), pp.262102. ⟨10.1063/5.0076424⟩. ⟨hal-03507440⟩



Record views


Files downloads